ORSHIN Attack Defense Framework

Electromagnetic fault injection causes fault leading to key extraction using differential fault analysis

Description

Electromagnetic fault injection causes fault leading to key extraction using differential fault analysis

CWE

CVE

Attack Surfaces

Cryptographic Algorithm Implementation (MITRE EMB3D PID-11)

Attack Vectors

Electromagnetic Side-Channel (MITRE EMB3D TID-102)

DFA

FA (MITRE EMB3D TID-105)

Defenses

Harden computations, Ineffective computations

Hide sensitive parts of the chip, Glue logic

Add shielding, Metal layers

Add security sensors, EM proximity sensor

Use modern technology, Smaller technology, 3D packaging

Hide critical operations, Instruction shuffling, Dummy instructions, Clock jitter