ORSHIN Attack Defense Framework

Laser fault injection causes fault leading to key extraction using differential fault analysis

Description

Laser fault injection causes fault leading to key extraction using differential fault analysis

CWE

CVE

Attack Surfaces

Cryptographic Algorithm Implementation (MITRE EMB3D PID-11)

Attack Vectors

DFA

FA (MITRE EMB3D TID-105)

Laser Attack

Defenses

Harden computations, Ineffective computations

Add security sensors, Light sensor, Temperature sensor

Hide sensitive parts of the chip, Glue logic

Add shielding, Metal layers

Use modern technology, Smaller technology, 3D packaging

Hide critical operations, Instruction shuffling, Dummy instructions, Clock jitter