ORSHIN Attack Defense Framework

Voltage Glitching causes fault leading to key extraction using differential fault analysis

Description

Voltage Glitching causes fault leading to key extraction using differential fault analysis

CWE

CVE

Attack Surfaces

Cryptographic Algorithm Implementation (MITRE EMB3D PID-11)

Attack Vectors

DFA

FA (MITRE EMB3D TID-105)

Voltage Glitching

Defenses

Harden computations, Ineffective computations

Add security sensors, Voltage sensor

Hide critical operations, Instruction shuffling, Dummy instructions, Clock jitter